| Display title | Quantum metrology |
| Default sort key | Quantum metrology |
| Page length (in bytes) | 12,678 |
| Namespace ID | 0 |
| Page ID | 2224097 |
| Page content language | en - English |
| Page content model | wikitext |
| Indexing by robots | Allowed |
| Number of redirects to this page | 0 |
| Counted as a content page | Yes |
| HandWiki item ID | None |
| Edit | Allow all users (infinite) |
| Move | Allow all users (infinite) |
| Page creator | imported>Rtextdoc |
| Date of page creation | 20:49, 6 February 2024 |
| Latest editor | imported>Rtextdoc |
| Date of latest edit | 20:49, 6 February 2024 |
| Total number of edits | 2 |
| Recent number of edits (within past 90 days) | 0 |
| Recent number of distinct authors | 0 |
Description | Content |
Article description: (description)
This attribute controls the content of the description and og:description elements. | Quantum metrology is the study of making high-resolution and highly sensitive measurements of physical parameters using quantum theory to describe the physical systems, particularly exploiting quantum entanglement and quantum squeezing. This field promises to develop measurement techniques that give... |
