| Display title | Physics:Non-contact atomic force microscopy |
| Default sort key | Non-contact atomic force microscopy |
| Page length (in bytes) | 36,320 |
| Namespace ID | 3020 |
| Namespace | Physics |
| Page ID | 643650 |
| Page content language | en - English |
| Page content model | wikitext |
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| Counted as a content page | Yes |
| Page image |  |
| HandWiki item ID | None |
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| Page creator | imported>OrgMain |
| Date of page creation | 00:32, 6 March 2023 |
| Latest editor | imported>OrgMain |
| Date of latest edit | 00:32, 6 March 2023 |
| Total number of edits | 1 |
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Description | Content |
Article description: (description)
This attribute controls the content of the description and og:description elements. | Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms) to the surface under study, the probe is then raster scanned... |
