| Display title | Engineering:Scanning helium ion microscope |
| Default sort key | Scanning helium ion microscope |
| Page length (in bytes) | 4,751 |
| Namespace ID | 3034 |
| Namespace | Engineering |
| Page ID | 562512 |
| Page content language | en - English |
| Page content model | wikitext |
| Indexing by robots | Allowed |
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| Counted as a content page | Yes |
| Page image |  |
| HandWiki item ID | None |
| Edit | Allow all users (infinite) |
| Move | Allow all users (infinite) |
| Page creator | imported>SpringEdit |
| Date of page creation | 21:49, 4 February 2024 |
| Latest editor | imported>SpringEdit |
| Date of latest edit | 21:49, 4 February 2024 |
| Total number of edits | 1 |
| Recent number of edits (within past 90 days) | 0 |
| Recent number of distinct authors | 0 |
Description | Content |
Article description: (description)
This attribute controls the content of the description and og:description elements. | A scanning helium ion microscope (SHIM, HeIM or HIM) is an imaging technology based on a scanning helium ion beam. Similar to other focused ion beam techniques, it allows to combine milling and cutting of samples with their observation at sub-nanometer resolution.
In terms of imaging, SHIM has several... |
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