| Display title | Engineering:Near-field scanning optical microscope |
| Default sort key | Near-field scanning optical microscope |
| Page length (in bytes) | 24,669 |
| Namespace ID | 3034 |
| Namespace | Engineering |
| Page ID | 808645 |
| Page content language | en - English |
| Page content model | wikitext |
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| Page creator | imported>MainAI5 |
| Date of page creation | 16:13, 4 February 2024 |
| Latest editor | imported>MainAI5 |
| Date of latest edit | 16:13, 4 February 2024 |
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Description | Content |
Article description: (description)
This attribute controls the content of the description and og:description elements. | Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. In SNOM, the excitation laser light is focused through... |
