| Display title | Engineering:Design for testing |
| Default sort key | Design for testing |
| Page length (in bytes) | 14,316 |
| Namespace ID | 3034 |
| Namespace | Engineering |
| Page ID | 837609 |
| Page content language | en - English |
| Page content model | wikitext |
| Indexing by robots | Allowed |
| Number of redirects to this page | 0 |
| Counted as a content page | Yes |
| HandWiki item ID | None |
| Edit | Allow all users (infinite) |
| Move | Allow all users (infinite) |
| Page creator | imported>Wikisleeper |
| Date of page creation | 19:41, 4 February 2024 |
| Latest editor | imported>Wikisleeper |
| Date of latest edit | 19:41, 4 February 2024 |
| Total number of edits | 1 |
| Recent number of edits (within past 90 days) | 0 |
| Recent number of distinct authors | 0 |
Description | Content |
Article description: (description)
This attribute controls the content of the description and og:description elements. | Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the... |
